Title :
Measurements and Modeling of Kinetic Inductance Microstrip Delay Lines
Author :
Pond, J.M. ; Claassen, J.H. ; Carter, W.L.
fDate :
May 9 1975-June 11 1987
Abstract :
Microstrip, with phase velocities of about 0.01c, employing kinetic inductance have been fabricated using niobium nitride and a silicon dielectric. Delay linea employing the phenomenon of kinetic inductance have several advantages for analog signal processing, including low loss and very compact size. An analysis of kinetic inductance microstrip delay lines has been made in the frequency domain and the time domain. The results were compared to theoretical predictions and an accurate circuit model was developed.
Keywords :
Delay lines; Dielectric measurements; Frequency domain analysis; Inductance measurement; Kinetic theory; Microstrip; Niobium compounds; Signal processing; Silicon; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132570
