DocumentCode
2695237
Title
Measurements and Modeling of Kinetic Inductance Microstrip Delay Lines
Author
Pond, J.M. ; Claassen, J.H. ; Carter, W.L.
Volume
2
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
925
Lastpage
928
Abstract
Microstrip, with phase velocities of about 0.01c, employing kinetic inductance have been fabricated using niobium nitride and a silicon dielectric. Delay linea employing the phenomenon of kinetic inductance have several advantages for analog signal processing, including low loss and very compact size. An analysis of kinetic inductance microstrip delay lines has been made in the frequency domain and the time domain. The results were compared to theoretical predictions and an accurate circuit model was developed.
Keywords
Delay lines; Dielectric measurements; Frequency domain analysis; Inductance measurement; Kinetic theory; Microstrip; Niobium compounds; Signal processing; Silicon; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132570
Filename
1132570
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