Title :
Measurement of third-order susceptibilities by a nonlinear image processing method
Author :
Chis, M. ; Boudebs, Georges ; Rivoire, G.
Author_Institution :
Universite d´Angers
fDate :
29 Aug-2 Sep 1994
Keywords :
Delay effects; Electronic switching systems; Image processing; Laser excitation; Optical filters; Optical scattering; Polarization; Probes; Propagation delay; Scattering parameters;
Conference_Titel :
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN :
0-7803-1791-2
DOI :
10.1109/EQEC.1994.698162
