DocumentCode
2695715
Title
Measurement of third-order susceptibilities by a nonlinear image processing method
Author
Chis, M. ; Boudebs, Georges ; Rivoire, G.
Author_Institution
Universite d´Angers
fYear
1994
fDate
29 Aug-2 Sep 1994
Firstpage
79
Lastpage
79
Keywords
Delay effects; Electronic switching systems; Image processing; Laser excitation; Optical filters; Optical scattering; Polarization; Probes; Propagation delay; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN
0-7803-1791-2
Type
conf
DOI
10.1109/EQEC.1994.698162
Filename
698162
Link To Document