DocumentCode
2695878
Title
Peak electrical field strength at hard explosions of conductors
Author
Burtsev, V.A. ; Kalinin, N.V.
Author_Institution
Efremov Sci. Res. Inst. of Electrophys. Apparatus, NIIEFA, St. Petersburg, Russia
Volume
2
fYear
2003
fDate
15-18 June 2003
Firstpage
1343
Abstract
The problems, connected with obtaining high peaked voltages U/sub m/ and electrical field strengths E/sub m/ at hard explosions of foils, when the stored specific magnetic energy essentially exceeds sublimation energy, are considered. Results of the analysis of experimental data and numerical researches showed, that in the locally optimized regimes the above-mentioned quantities are defined mainly by minimal electrical conductivity of explosion products, corresponding to metal-nonmetal-plasma transition. The density at this transition differs from liquid metal density at temperature T/sub b//sup st/ by several tens of percents. In hard regimes the ionizing phenomena and shunting discharge make impossible to receive high value of U/sub m/ and E/sub m/ if the surrounding arc-quenching medium has not enough high electric strength. In case when this electrical strength is sufficient, metal plasma produced by explosion and heated by Joule mechanism does not preclude attainment of high values U/sub m/ and E/sub m/ as it arises after finishing of the phase transition.
Keywords
conductors (electric); electric fields; electrical conductivity; explosions; ionisation; sublimation; Joule mechanism; arc-quenching medium; conductor explosions; electrical conductivity; electrical field strength; explosion products; ionizing phenomena; magnetic energy; metal plasma; metal-nonmetal-plasma transition; peak voltages; phase transition; shunting discharge; sublimation energy; Aluminum; Conductivity; Conductors; Data analysis; Explosions; Magnetic analysis; Plasma density; Plasma temperature; Resistance heating; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-7915-2
Type
conf
DOI
10.1109/PPC.2003.1278063
Filename
1278063
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