DocumentCode
2696157
Title
A 25 kV, 75 kHz, kicker for measurement of muon lifetime
Author
Barnes, M.J. ; Wait, G.D.
Author_Institution
TRIUMF, Vancouver, BC, Canada
Volume
2
fYear
2003
fDate
15-18 June 2003
Firstpage
1407
Abstract
An international collaboration plans to measure the lifetime of the muon to a precision of 1 ppm. The "MuLan" experiment will take place at the Paul Scherrer Institut (PSI) in Northern Switzerland. The MuLan method requires a fast beam line kicker, which can turn the beam on and off, to invoke an artificial time structure on the continuous beam which has a 50.6 MHz time microstructure. The kicker needs to run with a standard "on-off time cycle" or in a "muon on request" mode. The MuLan kicker will consist of 2 pairs of deflector plates mechanically in series, driven by 4 MOSFET modulators. Each modulator consists of two stacks of MOSFETs operating in push pull mode. The specifications for the kicker demand that the rise and fall times of the deflector plate voltage are not more than 45 ns. There is a requirement for an adjustable output voltage from 0 V to /spl plusmn/12.5 kV per deflector plate, a minimum pulse duration of 200 ns, and adjustable repetition rate up to a maximum of 50 kHz, continuous. Short turn-on and turn-off delays are required for the "muon on request" mode; the measured propagation delay is 200 ns. The specifications also require that the polarity of the pulses on the plates be selectable, although not on a pulse-by-pulse basis. This paper describes the novel design of the kicker, and presents both PSpice predictions and measurements.
Keywords
MOSFET; SPICE; delays; modulators; muon detection; muons; -12.5 to 12.5 kV; 200 ns; 25 kV; 45 ns; 50 kHz; 50.6 MHz; 75 kHz; MOSFET modulators; MuLan experiment; MuLan kicker; PSpice measurement; PSpice predictions; deflector plates; fast beam line kicker; muon lifetime measurement; muon on request mode; on-off time cycle; propagation delay measurement; pulse duration; push pull mode; turn-off delays; turn-on delays; Capacitance; Finite element methods; Insulation; International collaboration; MOSFET circuits; Mesons; Microstructure; Propagation delay; Pulse modulation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-7915-2
Type
conf
DOI
10.1109/PPC.2003.1278079
Filename
1278079
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