DocumentCode :
2696165
Title :
On the accommodation of coolant flow paths in high-density packaging
Author :
Nakayama, Wataru
Author_Institution :
Hitachi Ltd., Ibaraki, Japan
fYear :
1990
fDate :
23-25 May 1990
Firstpage :
101
Lastpage :
112
Abstract :
An analytical study was carried out to highlight the need to work out a tradeoff between the switching speed of logic gates and the average wiring distance, taking into account coolant flow distribution within the information processing system, in order to achieve the maximum processing speed at the system level. One of the models is composed of a row of gate-carrying cards flanked by side boards with networks to complete the three-dimensional wiring. The gates are cooled by forced convection of FC-77 or water. It is shown that the advantage of the 3D configuration in the reduction of wiring distance is seriously compromised by the need to make room for coolant channels within the system to such an extent that in certain cases the single-card system is favored over multiple-card systems. As a model of the single-card system, a square array of logic gates cooled by impinging liquid jets is considered. Again, it is concluded that the space requirement of coolant flows could set the upper bound for the density of logic gate packing. The case studies indicate that a gate-level heat flux of 100 W/cm2 is a difficult target to achieve on a processor composed of a large number of gates
Keywords :
cooling; design engineering; digital circuits; packaging; 3D configuration; FC-77 coolant; accommodation of coolant flow paths; analytical study; average wiring distance; boards with networks; coolant flow distribution; cooled by impinging liquid jets; forced convection; gate-level heat flux; high-density packaging; information processing system; multiple-card systems; reduction of wiring distance; room for coolant channels; row of gate-carrying cards; single-card system; space requirement of coolant flows; square array of logic gates; switching speed of logic gates; switching speed wiring distance tradeoff; three-dimensional wiring; upper bound of logic gate density; water coolant; Coolants; Information processing; Logic arrays; Logic gates; Mechanical engineering; Packaging machines; Space cooling; Space heating; Wafer scale integration; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1990. I-THERM II., InterSociety Conference on
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ITHERM.1990.113319
Filename :
113319
Link To Document :
بازگشت