Title :
Numerical Simulations of Emission and Bistatic Scattering from Soils with Rough Surfaces of Exponential Correlation Functions
Author :
Xu, Peng ; Tsang, Leung ; Chen, Kun Shan
Author_Institution :
Center for Space & Remote Sensing Res., Nat. Central Univ., Chung-Li
Abstract :
In this paper, we report on the polarimetric active and passive microwave remote signatures for exponential correlation function surfaces. Applications are in soil moisture problems at the frequencies L, C and X band. We use the same physical parameters of rms heights and correlation lengths at the three frequencies. Results for 2D case with rms height up to 2 wavelengths at X band are shown. The hybrid UV-SMCG method for RWG basis is also used to accelerate MoM solution. Comparisons are made with SPM, KA and AIEM predictions. We also compare backscattering between horizontal and vertical polarization cases at different rms heights with exponential correlation. At small rms height, the backscattering for vertical polarization case is larger than that for horizontal polarization case. On the other hand, at large rms height, the backscattering for horizontal polarization case is larger.
Keywords :
backscatter; moisture; numerical analysis; remote sensing; rough surfaces; soil; surface roughness; AIEM prediction; C-band; Gaussian correlation function; KA prediction; L-band; MoM solution; SPM prediction; X-band; backscattering; bistatic scattering; correlation length; exponential correlation function; horizontal polarization; hybrid UV-SMCG method; numerical simulation; polarimetric microwave remote signature; rms height; soil moisture; soil physical parameter; soil rough surface; vertical polarization; Acceleration; Backscatter; Frequency; Numerical simulation; Polarization; Rough surfaces; Scanning probe microscopy; Scattering; Soil moisture; Surface roughness; One; five; four; three; two;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4780041