• DocumentCode
    2696489
  • Title

    Monte Carlo Simulation of Altimeter Pulse Returns and Electromagnetic Bias

  • Author

    Naenna, Praphun ; Johnson, Joel T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng. & ElectroScience Lab., Ohio State Univ., Columbus, OH
  • Volume
    5
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    The electromagnetic bias is a critical error term in sea surface height estimation from satellite radar altimetry. While the electromagnetic bias has been studied extensively, most studies are based on low-order hydrodynamic and electromagnetic models. This paper proposes an alternate approach for electromagnetic bias studies by employing a Monte Carlo procedure with numerical non-linear hydrodynamic simulations coupled with numerical methods for electromagnetic scattering from the sea surface. A deterministic set of sea surface profiles and the corresponding altimeter pulse returns are produced in the simulation. The coupled electromagnetic/hydrodynamic methods can be chosen to tradeoff varying levels of physical fidelity with computational efficiency. The approach allows studies of the impact of various physical effects on the electromagnetic bias. Clear evidence of the electromagnetic bias can be observed in the simulated pulse returns in terms of a shift in the pulse return time.
  • Keywords
    Monte Carlo methods; oceanographic techniques; radar altimetry; remote sensing by radar; sea level; Monte Carlo simulation; altimeter pulse returns; electromagnetic bias; nonlinear hydrodynamic simulations; satellite radar altimetry; sea surface height estimation; Altimetry; Computational modeling; EMP radiation effects; Electromagnetic coupling; Electromagnetic modeling; Electromagnetic scattering; Hydrodynamics; Satellites; Sea surface; Spaceborne radar; Altimetry; Monte Carlo simulation; electromagnetic bias; pulse return;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4780042
  • Filename
    4780042