• DocumentCode
    2696495
  • Title

    Three-dimensional integration of optical multi-chips using surface-activated bonding for high-density microsystems packaging

  • Author

    Higurashi, Eiji ; Chino, Daisuke ; Suga, Tadatomo ; Sawada, Renshi

  • Author_Institution
    Res. Center for Adv. Sci. & Technol., Univ. of Tokyo, Tokyo
  • fYear
    2008
  • fDate
    11-14 Aug. 2008
  • Firstpage
    62
  • Lastpage
    63
  • Abstract
    The hybrid integration of multiple chips in three dimensions is an important technology for realizing highly functional, compact optoelectronic microsystems. In this study, three-dimensional integration of optical chips was successfully performed using Au-Au surface-activated bonding (bonding temperature: 150degC). The fabricated microsystem consists of two elements: i) a micromachined silicon optical bench incorporating a bonded laser diode, micromirrors, and through-hole electrodes; and ii) a glass substrate incorporating bonded photodiodes, electrical interconnections, and refractive microlenses. The silicon optical bench and the glass substrate were vertically stacked by surface-activated bonding. The size of the fully integrated microsystem is only 2.6 mm times 2.6 mm times 1 mm thick. The design and fabrication process allow chip-scale and wafer-level packaging. In addition, application for laser Doppler velocimeter sensor is discussed.
  • Keywords
    Doppler measurement; chip scale packaging; integrated optoelectronics; laser velocimeters; micromechanical devices; semiconductor lasers; wafer level packaging; 3D integration; bonded laser diode; chip-scale packaging; electrical interconnections; high-density microsystems packaging; hybrid integration; laser Doppler velocimeter sensor; micromachined silicon; micromirrors; optical bench; optical multichips; optoelectronic microsystems; refractive microlenses; surface activated bonding; wafer-level packaging; Diode lasers; Glass; Integrated optics; Optical interconnections; Optical refraction; Optical sensors; Packaging; Silicon; Temperature; Wafer bonding; Compact packaging; Hybrid integration; Surface activated bonding; Three-dimensional integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMs and Nanophotonics, 2008 IEEE/LEOS Internationall Conference on
  • Conference_Location
    Freiburg
  • Print_ISBN
    978-1-4244-1917-3
  • Electronic_ISBN
    978-1-4244-1918-0
  • Type

    conf

  • DOI
    10.1109/OMEMS.2008.4607829
  • Filename
    4607829