• DocumentCode
    2696777
  • Title

    400nm InGaN/GaN and InGaN/AlGaN multiquantum well light-emitting diodes

  • Author

    Chang, S.J. ; Kuo, C.H. ; Su, Y.K. ; Wu, L.W. ; Sheu, J.K. ; Wen, T.C. ; Lai, W.C. ; Chen, J.F. ; Tsai, J.M.

  • Author_Institution
    Inst. of Microelectron., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2003
  • fDate
    12-14 Sept. 2003
  • Firstpage
    91
  • Lastpage
    94
  • Abstract
    400 nm In0.05Ga0.95N/GaN MQW light emitting diode (LED) structure and In0.05Ga0.95N/Al0.1Ga0.9N LED structure were both prepared by organometallic vapor phase epitaxy (OMVPE). It was found that the use of Al0.1Ga0.9N as the material for barrier layers would not degrade crystal quality of the epitaxial layers. It was also found that the 20 mA electroluminescence (EL) intensity of InGaN/AlGaN multiquantum well (MQW) LED was two times larger than that of the InGaN/GaN MQW LED. The larger maximum output intensity and the fact that maximum output intensity occurred at larger injection current suggest that AlGaN barrier layers can provide a better carrier confinement and effectively reduce leakage current.
  • Keywords
    III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor epitaxial layers; semiconductor quantum wells; vapour phase epitaxial growth; wide band gap semiconductors; 20 mA; 20 mA electroluminescence intensity; 400 nm; 400 nm In0.05Ga0.95N/GaN MQW light emitting diode; 400 nm InGaN/AlGaN multiquantum well light-emitting diodes; 400 nm InGaN/GaN multiquantum well light-emitting diodes; AlGaN barrier layers; In0.05Ga0.95N-Al0.1Ga0.9N; In0.05Ga0.95N-GaN; In0.05Ga0.95N/Al0.1Ga0.9N LED structure; InGaN/AlGaN multiquantum well LED; InGaN/GaN MQW LED; MQW; barrier layers; carrier confinement; epitaxial layers; injection current; leakage current; organometallic vapor phase epitaxy; Aluminum gallium nitride; Carrier confinement; Crystalline materials; Degradation; Electroluminescence; Epitaxial growth; Epitaxial layers; Gallium nitride; Light emitting diodes; Quantum well devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronics, Proceedings of the Sixth Chinese Symposium
  • Print_ISBN
    0-7803-7887-3
  • Type

    conf

  • DOI
    10.1109/COS.2003.1278172
  • Filename
    1278172