Title :
Effects of multi doped zones on the current-voltage characteristics and EL spectra in organic light emitting diodes
Author :
Juang, Fuh-Shyang ; Tsai, Yu-Sein ; Lin, Shin-Ju
Author_Institution :
Dept. of Electro-Opt. Eng., Nat. Huwei Inst. of Technol., Yunlin, Taiwan
Abstract :
The narrow rubrene-doped zones were located in the emitting layer, AlQ3. The effects of doped-zone width, position and zone number on the electroluminescence (EL) intensity of organic light emitting diodes (OLEDs) were studied. The current-voltage characteristics were also studied according to the trap charge limited (TCL) transport models. When the doped zone width increased, the EL intensity decreased dramatically due to the large trapping defects introduced by rubrene molecules. When a single doped zone is placed adjacent to the TPD/AlQ3 interface, the EL spectra have higher intensity. As the doped zone location moved away from the TPD/AlQ3 interface to the cathode, the conduction current decreased, the turn-on voltage increased and the EL efficiency decreased due to insufficient amount of holes can diffuse to the doped zone to recombine with trapped electrons in doped regions. Double and triple doped zones structures were used to fabricate the devices. The double doped-zone structure has the highest EL intensity. The emission intensity was more than 4 times higher than that of a single doped diode.
Keywords :
aluminium compounds; cathodes; doping profiles; electroluminescence; electron traps; electron-hole recombination; interface structure; organic light emitting diodes; organic semiconductors; EL intensity; EL spectra; TPD/AlQ3 interface; cathode; conduction current; current-voltage characteristics; doped-zone structure; electroluminescence; electron-hole recombination; emitting layer; multi doped zones; organic light emitting diodes; rubrene molecules; rubrene-doped zones; trap charge limited transport models; trapping defects; turn-on voltage; Cathodes; Charge carrier processes; Charge carriers; Current-voltage characteristics; Doping; Electroluminescence; Organic light emitting diodes; Spontaneous emission; Substrates; Voltage;
Conference_Titel :
Optoelectronics, Proceedings of the Sixth Chinese Symposium
Print_ISBN :
0-7803-7887-3
DOI :
10.1109/COS.2003.1278175