DocumentCode
2696975
Title
Soft errors from neutron and proton-induced multiple-node events
Author
Cannon, Ethan H.
Author_Institution
Boeing Co., Seattle, WA, USA
fYear
2010
fDate
2-6 May 2010
Firstpage
1019
Lastpage
1025
Abstract
We present geometric models to calculate the rate of multiple node events that can defeat soft error mitigation based on spatial redundancy. One aspect of our model determines the probability of an ion crossing two nodes, while the second part considers two different daughter particles from a neutron or proton collision affecting two nodes.
Keywords
SRAM chips; cosmic ray neutrons; cosmic ray protons; integrated circuit reliability; redundancy; SRAM cells; cosmic ray neutrons; geometric models; ion crossing probability; neutron-induced multiple-node event rate; proton-induced multiple-node event rate; soft error mitigation; spatial redundancy; CMOS technology; Collision mitigation; Error correction codes; Flip-flops; Joining processes; Neutrons; Protons; Random access memory; Redundancy; Solid modeling; cosmic ray neutrons; protons; single event upsets; soft errors;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-5430-3
Type
conf
DOI
10.1109/IRPS.2010.5488682
Filename
5488682
Link To Document