Title :
Real-time bit error monitoring system (BEMS) for optical communication by use of high speed optical logic gates
Author :
Qureshi, K.K. ; Chan, L.Y. ; Lui, L. F K ; Wai, P.K.A. ; Tam, H.Y.
Author_Institution :
Photonics Res. Centre, Hong Kong Polytech. Univ., Hung Mom, China
Abstract :
A novel bit error monitoring system is realized all-optically using cascaded optical NOT and optical NOR gate operating at different thresholds. This scheme generates real time optical monitoring signal which indicates the positions and duration of bit and burst errors in 10 Gbit/s signal.
Keywords :
laser mode locking; logic gates; monitoring; optical fibre communication; optical fibre testing; optical logic; optical wavelength conversion; real-time systems; semiconductor lasers; telecommunication network reliability; 10 Gbit/s; bit errors; burst errors; cascaded optical NOT gate; injection mode-locked Fabry-Perot laser diodes; optical NOR gate; optical communication; polarization mode dispersion; real time optical monitoring signal; real-time bit error monitoring system; High speed optical techniques; Logic gates; Monitoring; Optical fiber communication; Optical fiber networks; Optical wavelength conversion; Photonics; Real time systems; Signal generators; Signal processing;
Conference_Titel :
Optoelectronics, Proceedings of the Sixth Chinese Symposium
Print_ISBN :
0-7803-7887-3
DOI :
10.1109/COS.2003.1278194
