DocumentCode :
2697203
Title :
SAR Imaging Simulation for an Inhomogeneous Undulated Lunar Surface based on Triangulated Irregular Network
Author :
Jin, Ya-Qiu ; Fa, Wenzhe ; Xu, Feng
Author_Institution :
Key Lab. of Wave Scattering & Remote Sensing Inf., Fudan Univ., Shanghai
Volume :
5
fYear :
2008
fDate :
7-11 July 2008
Abstract :
Based on the statistics of the lunar cratered terrain, e.g. population, dimension and shape of craters, the terrain feature of cratered lunar surface is numerically generated. According to inhomogeneous distribution of the lunar surface slope, the triangulated irregular network is employed to make the digital elevation of lunar surface model. The Kirchhoff approximation of rough surface scattering is then applied to simulation of lunar surface scattering. The synthetic aperture radar (SAR) image for comprehensive cratered lunar surfaces is numerically generated. Making use of the digital elevation and Clementine UVVIS data at Apollo 15 landing site as the ground truth, an SAR image at Apollo 15 landing site is simulated.
Keywords :
lunar surface; planetary remote sensing; remote sensing by radar; spaceborne radar; synthetic aperture radar; Apollo 15 landing site; Clementine UWIS data; Kirchhoff approximation; Moon; SAR image; digital elevation; inhomogeneous undulated lunar surface; lunar crater dimension; lunar crater morphology; lunar crater population; lunar crater shape; lunar cratered terrain feature; lunar surface model; lunar surface topography; rough surface scattering; spaceborne radar technique; synthetic aperture radar; triangulated irregular network; Acoustic scattering; Moon; Optical scattering; Optical surface waves; Radar polarimetry; Radar scattering; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Back Projection (BP; SAR imaging; Triangulated Irregular Network (TIN); cratered terrain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
Type :
conf
DOI :
10.1109/IGARSS.2008.4780076
Filename :
4780076
Link To Document :
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