Title :
Counterpropagating entangled photons in a periodically poled nonlinear waveguide
Author :
Booth, Mark C. ; Atature, Mete ; Giuseppe, Giovanni Di ; Sergienko, Alexander V. ; Saleh, Bahaa E A ; Teich, Malvin C.
Author_Institution :
Dept. of Biomed. Eng., Boston Univ., MA, USA
Abstract :
Entangled photons, which may be generated through the process of spontaneous parametric down-conversion (SPDC) in a crystal with χ(2) nonlinearity, have long been in the spotlight for quantum-optics experiments. The generation of entangled photons by quasi-phase matching (QPM) in lithium niobate offers the promise of increased photon-pair production and, with the integration of a waveguide structure, control of the spatial characteristics of the down-converted photons. It turns out that the use of a waveguide structure, in conjunction with periodic poling to achieve quasi-phase matching, offers another critically important feature: the possibility of generating counterpropagating signal and idler photons. We consider the conditions required for generating counterpropagating photon beams and explore some of the unique properties of this source of light using a periodically poled LiNbO3 waveguide.
Keywords :
dielectric polarisation; lithium compounds; optical frequency conversion; optical parametric devices; optical phase matching; photorefractive materials; quantum optics; LiNbO3; counterpropagating entangled photons; counterpropagating photon beams; counterpropagating signal; down-converted photons; entangled photons; idler photons; nonlinearity; periodically poled LiNbO3 waveguide; periodically poled nonlinear waveguide; photon-pair production; quantum-optics experiments; quasi-phase matching; spatial characteristics; spontaneous parametric down-conversion; waveguide structure integration; Biomedical computing; Biomedical imaging; Laser excitation; Optical control; Photonic crystals; Physics; Quantum computing; Quantum entanglement; Solids; Tuning;
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7500-9
DOI :
10.1109/LEOS.2002.1133929