• DocumentCode
    2697553
  • Title

    Global Microwave Emission Depth Analyses from AMSR-E, SSMI, and MODIS

  • Author

    Galantowicz, John F. ; Moncet, Jean-Luc ; Liang, Pan ; Lipton, Alan E.

  • Author_Institution
    Atmos. & Environ. Res. (AER), Inc., Lexington, MA
  • Volume
    5
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    A global analysis of microwave emission depth signatures shows that the characteristic temporal behaviors associated with subsurface emission in sand deserts carry over to arid and semi-arid regions worldwide. Previous work showed that the greatly reduced diurnal range of SSM/I brightness temperatures compared to skin temperatures in deserts could be explained by microwave effective emission depths that depended on soil type and microwave wavelength. Here, a similar methodology is applied globally with coincident Aqua AMSR-E and MODIS data used in addition to SSM/I, providing a more complete sample of diurnal cycle extremes. The signatures of significant microwave emission depths can be seen to occur in drier regions globally not dominated by dense forest or crop cover-including, for example, the western half of the continental United States, south central Asia, Australia, and southern Africa and South America.
  • Keywords
    land surface temperature; microwave measurement; radiometry; remote sensing; soil; vegetation; AMSR-E; Australia; MODIS; SSMI; South America; arid regions; brightness temperature profile; continental United States; crop cover; dense forest cover; global microwave emission depth analysis; microwave effective emission depth; sand deserts; semiarid region; skin temperature; soil type; south central Asia; southern Africa; subsurface emission; Africa; Asia; Australia; Brightness temperature; Crops; MODIS; Skin; Soil; Temperature dependence; Temperature distribution; Microwave radiometry; emission depth; microwave emissivity; penetration depth;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4780096
  • Filename
    4780096