DocumentCode
2698067
Title
Electronic failures in spacecraft environments
Author
Sheldon, Douglas J.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2010
fDate
2-6 May 2010
Firstpage
759
Lastpage
762
Abstract
This paper will provide a review of data describing electronic part failures in spacecraft environments. The details of the spacecraft environment and their individual contributions to the overall failure population will be described. The paper will also present an analysis of new data regarding electronic part failures during spacecraft assembly and test. This data provides an indication of incoming part level quality and insight into handling practices.
Keywords
failure analysis; space vehicles; electronic part failures; incoming part level quality; spacecraft assembly; spacecraft environment; Aerospace electronics; Aircraft manufacture; Degradation; Failure analysis; Instruments; Ionizing radiation; Satellites; Single event upset; Space vehicles; Testing; component; electronic parts; failure; radiation; reliabiity; spacecraft;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-5430-3
Type
conf
DOI
10.1109/IRPS.2010.5488739
Filename
5488739
Link To Document