Storage-work joint degradation model for discontinuous-working devices

For discontinuous-working devices, storage and work states may appear alternately. The health state of the device can be monitored by observing key performance parameters in engineering, which can be also taken as a basis to predict and analyze life and reliability of the device. For this kind of device, this paper comprehensively analyzes performance degradation mechanism in storage and working conditions, and establishes a storage-work joint model for the device, then estimates parameters of the joint degradation model by analyzing performance degradation data with change point characteristic. On this basis, reliability analysis and life prediction will be achieved. In the end of this paper, a joint degradation model of the metalized film capacitor will be established, and the reliability and life of the capacitor will also be calculated and predicted.