DocumentCode

2698539

Title

Hot-carrier effects in 0.15μm low dose SIMOX N-MOSFETs

Author

Dimitrakis, P. ; Jornaah, J. ; Balestra, F. ; Papaioannou, G.J.

Author_Institution

University of Athens

fYear

2000

fDate

2000

Firstpage

59

Lastpage

62

Keywords

Aging; Degradation; Doping; Hot carrier effects; Hot carriers; MOSFET circuits; Semiconductor films; Stress; Testing; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on

Print_ISBN

0-7803-5939-9

Type

conf

DOI

10.1109/ASDAM.2000.889452

Filename

889452