Title :
Hot-carrier effects in 0.15μm low dose SIMOX N-MOSFETs
Author :
Dimitrakis, P. ; Jornaah, J. ; Balestra, F. ; Papaioannou, G.J.
Author_Institution :
University of Athens
Keywords :
Aging; Degradation; Doping; Hot carrier effects; Hot carriers; MOSFET circuits; Semiconductor films; Stress; Testing; Threshold voltage;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on
Print_ISBN :
0-7803-5939-9
DOI :
10.1109/ASDAM.2000.889452
