DocumentCode
2698884
Title
Bidimensional empirical mode decomposition for biometric analysis and Iris recognition
Author
Guaragnella, C. ; Manni, A. ; Palumbo, F. ; Politi, T.
Author_Institution
Electrics & Electron. Dept., Politec. di Bari, Bari, Italy
fYear
2010
fDate
6-8 Sept. 2010
Firstpage
30
Lastpage
33
Abstract
A novel BEMD based Iris recognition system is presented. A multilayer processing for features extraction makes the system efficient. The use of geometrically described details information makes the iris signature very efficient in reducing false positive and false negatives occurrences. Preliminary results of the proposed algorithm seem to indicate BEMD can give high accuracy in iris recognition subsystems in comparison with other techniques.
Keywords
feature extraction; iris recognition; bidimensional empirical mode decomposition; biometric analysis; features extraction; iris recognition system; multilayer processing; Data mining; Databases; Feature extraction; Humans; Image color analysis; Interpolation; Iris recognition; bidimensional; biometrics; empirical mode decomposition; features; iris recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Measurement Systems and Applications (CIMSA), 2010 IEEE International Conference on
Conference_Location
Taranto
Print_ISBN
978-1-4244-7228-4
Type
conf
DOI
10.1109/CIMSA.2010.5611761
Filename
5611761
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