• DocumentCode
    2698969
  • Title

    Reliability of microelectronics packaging in the era of EnergyWise and Borderless networks

  • Author

    Li, Li ; Xue, Jie

  • Author_Institution
    Technol. & Quality, Cisco Syst. Inc., San Jose, CA, USA
  • fYear
    2010
  • fDate
    2-6 May 2010
  • Firstpage
    440
  • Lastpage
    445
  • Abstract
    In an ever-increasingly connected world, the boundaries or obstacles to accessing information are being torn down by business necessity, personal preferences and technical innovations. The Borderless Network is creating the ability for customers to work anywhere, with any device using services and applications like video, collaboration, with a secure, reliable and seamless communication experience. The customer will also experience reduced energy consumption from network attached devices thanks to innovations made in the microelectronic devices, systems that enable the next generation of smart and EnergyWise networks. In this paper, challenges and opportunities in reliability of microelectronics packaging for the next generation of EnergyWise, Borderless networks will be reviewed. The impact of materials, manufacturing processes and field environmental conditions on the packaging reliability will be discussed with one case study.
  • Keywords
    integrated circuit packaging; integrated circuit reliability; Borderless networks; EnergyWise networks; manufacturing process; microelectronic device; microelectronics packaging reliability; network attached device; reduced energy consumption; secure communication; Computer networks; Costs; Energy consumption; Materials reliability; Microelectronics; Next generation networking; Packaging machines; Power system reliability; Technological innovation; Telecommunication network reliability; EnergyWise; low power design; microelectronics packaging; reliability; temperature and humidity effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2010 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-5430-3
  • Type

    conf

  • DOI
    10.1109/IRPS.2010.5488791
  • Filename
    5488791