Title :
GaN deposition on AlN/Si substrates for FEAs
Author :
Lasisz, St ; Korbutowicz, R. ; Paszkiewicz, R. ; Czarczynski, W. ; Znamirowski, Z.
Author_Institution :
Inst. of Microsyst. Technol., Wroclaw Univ. of Technol., Poland
Abstract :
The GaN epitaxy on Si substrates shaped specifically for field emission arrays (FEAs) has been described. In such applications the substantial thing is to deposit GaN crystals on tops of Si micropyramids or cones. To achieve such a goal an auxiliary layer of AlN has been applied. It is well known that GaN has far better matching of lattice with AlN compared to Si. It appears that GaN prefers to grow on AlN, too. Furthermore AlN and GaN layers can be grown in the same epitaxy process. In this work the MOVPE method was used
Keywords :
III-V semiconductors; MOCVD; gallium compounds; grain size; semiconductor epitaxial layers; semiconductor growth; vacuum microelectronics; vapour phase epitaxial growth; wide band gap semiconductors; GaN-AlN-Si; MOVPE; Si; Si cones; Si micropyramids; Si substrates; field emission arrays; grain size; Crystallization; Crystals; Electron guns; Epitaxial growth; Epitaxial layers; Gallium nitride; Grain size; Lattices; Silicon; Substrates;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on
Conference_Location :
Smolenice
Print_ISBN :
0-7803-5939-9
DOI :
10.1109/ASDAM.2000.889502