DocumentCode
2699308
Title
Solar cell interface stability probed by charge extraction
Author
Graham, R.L. ; France, C.E. ; Carter, S.A. ; Alers, G.B.
Author_Institution
Phys. Dept., Univ. of California, Santa Cruz, CA, USA
fYear
2010
fDate
2-6 May 2010
Firstpage
323
Lastpage
326
Abstract
Electrical properties of CdTe Schottky solar cells were investigated during exposure to air. Trap states were probed and characterized using charge extraction. Mechanisms for degradation are discussed, and it is argued that degradation in this case is due to instability at the interface between CdTe and the metal electrode.
Keywords
II-VI semiconductors; cadmium compounds; reliability; solar cells; stability; CdTe; CdTe Schottky solar cells; charge extraction; degradation mechanism; electrical property; metal electrode; solar cell interface stability; trap states; Charge carrier processes; Degradation; Electrodes; Electron traps; Encapsulation; Excitons; Photonic band gap; Photovoltaic cells; Radiative recombination; Stability; CdTe; encapsulation; photovoltaic; reliability; solar cell; thin film;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-5430-3
Type
conf
DOI
10.1109/IRPS.2010.5488808
Filename
5488808
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