Title :
Solar cell interface stability probed by charge extraction
Author :
Graham, R.L. ; France, C.E. ; Carter, S.A. ; Alers, G.B.
Author_Institution :
Phys. Dept., Univ. of California, Santa Cruz, CA, USA
Abstract :
Electrical properties of CdTe Schottky solar cells were investigated during exposure to air. Trap states were probed and characterized using charge extraction. Mechanisms for degradation are discussed, and it is argued that degradation in this case is due to instability at the interface between CdTe and the metal electrode.
Keywords :
II-VI semiconductors; cadmium compounds; reliability; solar cells; stability; CdTe; CdTe Schottky solar cells; charge extraction; degradation mechanism; electrical property; metal electrode; solar cell interface stability; trap states; Charge carrier processes; Degradation; Electrodes; Electron traps; Encapsulation; Excitons; Photonic band gap; Photovoltaic cells; Radiative recombination; Stability; CdTe; encapsulation; photovoltaic; reliability; solar cell; thin film;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488808
