• DocumentCode
    2699315
  • Title

    Reliability aspects of organic light emitting diodes

  • Author

    Riedl, Thomas ; Winkler, Thomas ; Schmidt, Hans ; Meyer, Jens ; Schneidenbach, Daniel ; Johannes, Hans-Hermann ; Kowalsky, Wolfgang ; Weimann, Thomas ; Hinze, Peter

  • Author_Institution
    Inst. of Electron. Devices, Univ. of Wuppertal, Wuppertal, Germany
  • fYear
    2010
  • fDate
    2-6 May 2010
  • Firstpage
    327
  • Lastpage
    333
  • Abstract
    Various functional elements in organic optoelectronics devices are sensitive to oxygen an moisture. Thus, without an encapsulation the lifetime of organic light emitting diodes or organic solar cells does not meet the requirements of a serious application. We will discuss the particular challenges to form reliable, dense, pin-hole free thin-film barriers on top of organic devices. Specifically, atomic layer deposition (ALD) will be shown to be a highly attractive technique, that allows to operate at temperatures below 100°C. Particularly, the use of nanolaminates - multilayer structures of two alternating oxide materials - have evolved as a promising candidate to seal organic devices with a powerful moisture barrier. We will discuss the preparation technology of these barrier layers, the characterization of their gas permeation rate as well as their performance in real OLED devices. With a proper ALD barrier, the lifetime of an OLED operated at 1 000 cd/m2 can be increased to be well in excess of 20 000 h. For top-emitting or transparent OLEDs, the optical properties of the thin-film encapsulation layer can be used to concomitantly tune the light extraction efficiency of the devices.
  • Keywords
    atomic layer deposition; encapsulation; optical multilayers; organic light emitting diodes; thin films; ALD barrier; atomic layer deposition; gas permeation rate; light extraction efficiency; moisture barrier layer; nanolaminate-multilayer structures; organic light emitting diode reliability; organic optoelectronics devices; organic solar cells; pin-hole free thin-film barriers; thin-film encapsulation layer; top-emitting OLED; transparent OLED devices; Atomic layer deposition; Encapsulation; Moisture; Nanoscale devices; Nanostructures; Optoelectronic devices; Organic light emitting diodes; Photovoltaic cells; Temperature; Thin film devices; atomic layer deposition; encapsulation; nanolaminate; organic light emitting diodes; top-emitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2010 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-5430-3
  • Type

    conf

  • DOI
    10.1109/IRPS.2010.5488809
  • Filename
    5488809