• DocumentCode
    2699368
  • Title

    Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing

  • Author

    Albin, David S. ; Del Cueto, Joseph A.

  • Author_Institution
    Nat. Renewable Energy Lab. (NREL), Golden, CO, USA
  • fYear
    2010
  • fDate
    2-6 May 2010
  • Firstpage
    318
  • Lastpage
    322
  • Abstract
    In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C.
  • Keywords
    II-VI semiconductors; cadmium compounds; life testing; reliability; semiconductor thin films; solar cells; 1-sun illumination; CdTe; accelerated lifetime testing; acceleration temperature; capacitance-voltage hysteresis correlation; open-circuit bias; thin-film CdTe solar cell; zero-volt bias; Acceleration; Capacitance measurement; Capacitance-voltage characteristics; Hysteresis; Life estimation; Life testing; Lighting; Photovoltaic cells; Temperature; Transistors; Cadmium Telluride (CdTe); Capacitance Voltage Hysteresis; Deep Level Transient Spectroscopy (DLTS); Photovoltaic; Transient Capacitance; Transient Ion Drift (TID);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2010 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-5430-3
  • Type

    conf

  • DOI
    10.1109/IRPS.2010.5488811
  • Filename
    5488811