Title :
Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing
Author :
Albin, David S. ; Del Cueto, Joseph A.
Author_Institution :
Nat. Renewable Energy Lab. (NREL), Golden, CO, USA
Abstract :
In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C.
Keywords :
II-VI semiconductors; cadmium compounds; life testing; reliability; semiconductor thin films; solar cells; 1-sun illumination; CdTe; accelerated lifetime testing; acceleration temperature; capacitance-voltage hysteresis correlation; open-circuit bias; thin-film CdTe solar cell; zero-volt bias; Acceleration; Capacitance measurement; Capacitance-voltage characteristics; Hysteresis; Life estimation; Life testing; Lighting; Photovoltaic cells; Temperature; Transistors; Cadmium Telluride (CdTe); Capacitance Voltage Hysteresis; Deep Level Transient Spectroscopy (DLTS); Photovoltaic; Transient Capacitance; Transient Ion Drift (TID);
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488811