• DocumentCode
    2699884
  • Title

    The new mechanism for obtaining of the steep nonlinearities in the modern semiconductor structure

  • Author

    Korol, A.M. ; Tretyak, O.V. ; Sheka, D.I.

  • Author_Institution
    Ukrainian State Univ. for Food Technol., Kiev, Ukraine
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    The current-voltage characteristics of the semiconductor structure: the Schottky barrier (SB) incorporating the double barrier resonant-tunnelling structure, are evaluated and analysed. Since the SE can block (unblock) the resonant-tunnelling currents effectively enough the both very sharp and strong enhancement of the current is observed for the forward bias. For the backbiased structure considered, the region of the negative differential resistance takes place. The shape of the current-voltage curves depends on the parameters of the problem essentially
  • Keywords
    Schottky barriers; negative resistance; resonant tunnelling; Schottky barrier; current-voltage characteristics; double barrier resonant tunnelling structure; negative differential resistance; nonlinearity; semiconductor structure; Current-voltage characteristics; Electron emission; Food technology; Instruments; Resonance; Resonant tunneling devices; Schottky barriers; Semiconductor diodes; Shape; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on
  • Conference_Location
    Smolenice
  • Print_ISBN
    0-7803-5939-9
  • Type

    conf

  • DOI
    10.1109/ASDAM.2000.889542
  • Filename
    889542