DocumentCode
2699884
Title
The new mechanism for obtaining of the steep nonlinearities in the modern semiconductor structure
Author
Korol, A.M. ; Tretyak, O.V. ; Sheka, D.I.
Author_Institution
Ukrainian State Univ. for Food Technol., Kiev, Ukraine
fYear
2000
fDate
2000
Firstpage
449
Lastpage
451
Abstract
The current-voltage characteristics of the semiconductor structure: the Schottky barrier (SB) incorporating the double barrier resonant-tunnelling structure, are evaluated and analysed. Since the SE can block (unblock) the resonant-tunnelling currents effectively enough the both very sharp and strong enhancement of the current is observed for the forward bias. For the backbiased structure considered, the region of the negative differential resistance takes place. The shape of the current-voltage curves depends on the parameters of the problem essentially
Keywords
Schottky barriers; negative resistance; resonant tunnelling; Schottky barrier; current-voltage characteristics; double barrier resonant tunnelling structure; negative differential resistance; nonlinearity; semiconductor structure; Current-voltage characteristics; Electron emission; Food technology; Instruments; Resonance; Resonant tunneling devices; Schottky barriers; Semiconductor diodes; Shape; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on
Conference_Location
Smolenice
Print_ISBN
0-7803-5939-9
Type
conf
DOI
10.1109/ASDAM.2000.889542
Filename
889542
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