• DocumentCode
    2700255
  • Title

    Mixed wet and dry etching techniques for microneedles fabrication

  • Author

    Loyo, Héctor Maldonado ; de Rivera y Oyarzabal, Luis Niño

  • Author_Institution
    SEPI-ESIME Culhuacan, IPN, Mexico City, Mexico
  • fYear
    2011
  • fDate
    26-28 Oct. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Microneedle fabrication is usually: In-plane and out-of-plane processes. In-plane microneedles processes are used to fabricate microneedles with lower density than in out-of-plane ones. In there, the longitudinal axes are parallel to the substrate, shape and tip are defined by lithography, and then we can control easily the width, length, shape and tip of the microneedle. Out-of-plane microneedles are characterized by etch or mold depth, in these processes the longitudinal axes of the needles are perpendicular to the substrate imposing higher width (w) at the top of the microneedles then shapes and depth of the tip depends strongly on wet etching, as a function of the width of the microneedle base. Although out-of-plane microneedles have a higher density than in-plane microneedles is difficult to control the length and the shape of the tip. We propose in this paper a new approach for out-of-plane process design and fabrication to control the shape and tip of the microneedless using both: wet and dry etching, in order to take advantage of both processes. Results show that the wet and dry etching proposed can control the length and shape of the tip of the out-of-plane microneedle width.
  • Keywords
    etching; lithography; microfabrication; moulding; shape control; dry etching; in-plane microneedles; length control; lithography; longitudinal axes; microneedles fabrication; mold depth; out-of-plane microneedles; shape control; wet etching; Dry etching; Fabrication; Needles; Process control; Shape; Silicon; Wet etching; Microneedles; Out-of-plane; in-plane; wet and dry etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering Computing Science and Automatic Control (CCE), 2011 8th International Conference on
  • Conference_Location
    Merida City
  • Print_ISBN
    978-1-4577-1011-7
  • Type

    conf

  • DOI
    10.1109/ICEEE.2011.6106701
  • Filename
    6106701