Title :
Reliability modeling for ramp-stress accelerated degradation testing
Author :
Wang, Peng ; Coit, David W.
Author_Institution :
Hamilton Sundstrand Power Syst., United Technol. Corp., San Diego, CA, USA
Abstract :
This paper proposes a new approach to reliability modeling for units subjected to ramp-stress accelerated degradation test. The new approach is derived from cumulative damage theory and a Proportional Degradation Hazard Model. Step-stress approximation method is used. A numerical example is given to illustrate this approach.
Keywords :
approximation theory; life testing; reliability; stress analysis; cumulative damage theory; proportional degradation hazard model; ramp-stress accelerated degradation testing; reliability modeling; step-stress approximation method; Degradation; Hazards; Life estimation; Modeling; Reliability; Stress; Time measurement; acclerated degradation test; cumulative damage model; proportional degradation hazard model; ramp-stress;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2012 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-0786-4
DOI :
10.1109/ICQR2MSE.2012.6246347
