DocumentCode
2700286
Title
Reliability modeling for ramp-stress accelerated degradation testing
Author
Wang, Peng ; Coit, David W.
Author_Institution
Hamilton Sundstrand Power Syst., United Technol. Corp., San Diego, CA, USA
fYear
2012
fDate
15-18 June 2012
Firstpage
789
Lastpage
793
Abstract
This paper proposes a new approach to reliability modeling for units subjected to ramp-stress accelerated degradation test. The new approach is derived from cumulative damage theory and a Proportional Degradation Hazard Model. Step-stress approximation method is used. A numerical example is given to illustrate this approach.
Keywords
approximation theory; life testing; reliability; stress analysis; cumulative damage theory; proportional degradation hazard model; ramp-stress accelerated degradation testing; reliability modeling; step-stress approximation method; Degradation; Hazards; Life estimation; Modeling; Reliability; Stress; Time measurement; acclerated degradation test; cumulative damage model; proportional degradation hazard model; ramp-stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2012 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4673-0786-4
Type
conf
DOI
10.1109/ICQR2MSE.2012.6246347
Filename
6246347
Link To Document