DocumentCode
2700294
Title
A fast two-stage classification method of support vector machines
Author
Chen, Jin ; Wang, Cheng ; Wang, Runsheng
Author_Institution
Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha
fYear
2008
fDate
20-23 June 2008
Firstpage
869
Lastpage
872
Abstract
Classification of high-dimensional data generally requires enormous processing time. In this paper, we present a fast two-stage method of support vector machines, which includes a feature reduction algorithm and a fast multiclass method. First, principal component analysis is applied to the data for feature reduction and decorrelation, and then a feature selection method is used to further reduce feature dimensionality. The criterion based on Bhattacharyya distance is revised to get rid of influence of some binary problems with large distance. Moreover, a simple method is proposed to reduce the processing time of multiclass problems, where one binary SVM with the fewest support vectors (SVs) will be selected iteratively to exclude the less similar class until the final result is obtained. Experimented with the hyperspectral data 92AV3C, the results demonstrate that the proposed method can achieve a much faster classification and preserve the high classification accuracy of SVMs.
Keywords
pattern classification; support vector machines; Bhattacharyya distance; fast multiclass method; feature reduction algorithm; support vector machines; two-stage classification method; Decorrelation; Feature extraction; Filters; Hyperspectral imaging; Hyperspectral sensors; Independent component analysis; Principal component analysis; Support vector machine classification; Support vector machines; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Automation, 2008. ICIA 2008. International Conference on
Conference_Location
Changsha
Print_ISBN
978-1-4244-2183-1
Electronic_ISBN
978-1-4244-2184-8
Type
conf
DOI
10.1109/ICINFA.2008.4608121
Filename
4608121
Link To Document