DocumentCode :
270043
Title :
The Most Important DFT Tool
Author :
Davidson, Scott
Author_Institution :
Oracle, Systems Technology,
Volume :
30
Issue :
4
fYear :
2013
fDate :
Aug. 2013
Firstpage :
96
Lastpage :
96
Keywords :
Automatic test pattern generation; Discrete Fourier transforms; Integrated circuit modeling; Production facilities;
fLanguage :
English
Journal_Title :
Design & Test, IEEE
Publisher :
ieee
ISSN :
2168-2356
Type :
jour
DOI :
10.1109/MDAT.2013.2283589
Filename :
6658912
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=270043
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