DocumentCode

270043

Title

The Most Important DFT Tool

Author

Davidson, Scott

Author_Institution

Oracle, Systems Technology,

Volume

30

Issue

4

fYear

2013

fDate

Aug. 2013

Firstpage

96

Lastpage

96

Keywords

Automatic test pattern generation; Discrete Fourier transforms; Integrated circuit modeling; Production facilities;

fLanguage

English

Journal_Title

Design & Test, IEEE

Publisher

ieee

ISSN

2168-2356

Type

jour

DOI

10.1109/MDAT.2013.2283589

Filename

6658912