DocumentCode
2700627
Title
Robust single view room structure segmentation in Manhattan-like environments from stereo vision
Author
Olufs, Sven ; Vincze, Markus
Author_Institution
Autom. & Control Inst., Vienna Univ. of Technol., Vienna, Austria
fYear
2011
fDate
9-13 May 2011
Firstpage
5315
Lastpage
5322
Abstract
In this paper we propose a novel approach for the robust segmentation of room structure using Manhattan world assumption i.e. the frequently observed dominance of three mutually orthogonal vanishing directions in man-made environments. First, separate histograms are generated for the Cartesian major axis, i.e. X, Y and Z, on stereo data with an arbitrary roll, pitch and yaw rotation. Using the traditional Markov particle filters and minimal entropy as metric on the histograms, we are able to estimate the camera orientation with respect to orthogonal structure. Once the orientation is estimated we extract a hypotheses of the room structure by exploiting 2D histograms using mean shift clustering techniques as rough estimate for a pre-segmentation of voxels i.e. plane orientation and position. We apply superpixel over segmentation on the colour input to achieve a dense segmentation. The over segmentation and pre-segmented voxels are combined using graph-cuts for a not a-priori known number of final plane segments with a α-expansion graph cut variant proposed by Delong et al. with polynomial runtime. We show the robustness of our approach with respect to noise in real world data.
Keywords
Markov processes; estimation theory; filtering theory; image segmentation; rough set theory; stereo image processing; Cartesian major axis; Manhattan like environments; Manhattan world assumption; Markov particle filters; mean shift clustering; robust segmentation; robust single view room structure segmentation; rough estimation; stereo data; stereo vision; Cameras; Ellipsoids; Entropy; Histograms; Image edge detection; Robustness; Stereo vision;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation (ICRA), 2011 IEEE International Conference on
Conference_Location
Shanghai
ISSN
1050-4729
Print_ISBN
978-1-61284-386-5
Type
conf
DOI
10.1109/ICRA.2011.5980359
Filename
5980359
Link To Document