• DocumentCode
    2700645
  • Title

    Gene mapping by haplotype pattern mining

  • Author

    Toivonen, Hannu T T ; Onkamo, Päivi ; Vasko, Kari ; Ollikainen, Vesa ; Sevon, Petteri ; Mannila, Heikki ; Kere, Juha

  • Author_Institution
    Nokia Res. Center, Espoo, Finland
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    99
  • Lastpage
    108
  • Abstract
    Genetic markers are being increasingly utilized in gene mapping. The discovery of associations between markers and patient phenotypes - such as a disease status - enables the identification of potential disease gene loci. The rationale is that, in diseases with a reasonable genetic contribution, diseased individuals are more likely to have associated marker alleles near the disease susceptibility gene than control individuals. We describe a new gene mapping method-haplotype pattern mining (HPM) - that is based on discovering recurrent marker patterns. We define a class of useful haplotype patterns in genetic case-control data, give an algorithm for finding disease-associated haplotypes, and show how to use them to identify disease susceptibility loci. Experimental studies show that the method has good localization power in data sets with large degrees of phenocopies and with lots of missing and erroneous data. We also demonstrate how the method can be used to discover several genes simultaneously
  • Keywords
    data mining; diseases; genetics; medical computing; association discovery; disease gene loci identification; disease status; disease susceptibility; disease-associated haplotypes; erroneous data; gene mapping; genetic case-control data; genetic marker alleles; haplotype pattern mining; localization power; missing data; patient phenotypes; phenocopies; recurrent marker pattern discovery; Bioinformatics; Biological cells; Chromosome mapping; Computer science; Diseases; Frequency; Genetics; Genomics; History; Scientific computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bio-Informatics and Biomedical Engineering, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7695-0862-6
  • Type

    conf

  • DOI
    10.1109/BIBE.2000.889596
  • Filename
    889596