Title :
The implementing complicated digital bus device test using general purpose digital instrument
Author :
Wei, Qu ; Ning, Zhu
Author_Institution :
Jiangsu Autom. Res. Inst., R&D Dept., CSIC, Lianyungang, China
Abstract :
For the complicated digital bus device testing, there are two approaches: dedicated bus instrument and general-purpose digital IO instrument. The dedicated bus testers provide more advanced capability including exercising the bus, injecting errors, fully characterizing specification compliance for design validating and verification phase. This paper presents a modular solution based on the general-purpose digital IO instrument. By using built-in architectural elements such as the deep onboard memory, hardware handshaking, and an algorithmic engine, test engineers can increase the performance, modularity and simplification of test system.
Keywords :
automatic test equipment; digital instrumentation; peripheral interfaces; system buses; algorithmic engine; built-in architectural elements; bus instrument; deep onboard memory; design validation; design verification; digital bus device testing; error injection; general-purpose digital IO instrument; hardware handshaking; test system modularity; test system performance; test system simplification; Clocks; Computers; Hardware; Instruments; Synchronization; Testing; DTIF; bus interface; digital I/O instrument;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2012 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-0786-4
DOI :
10.1109/ICQR2MSE.2012.6246368