DocumentCode

270076

Title

Planned Unobsolescence

Author

Davidson, Scott

Author_Institution

Santa Clara,

Volume

30

Issue

6

fYear

2013

fDate

Dec. 2013

Firstpage

104

Lastpage

104

Keywords

Aging; Integrated circuits; Portable computers; Reliability; Software; Space vehicles;

fLanguage

English

Journal_Title

Design & Test, IEEE

Publisher

ieee

ISSN

2168-2356

Type

jour

DOI

10.1109/MDAT.2013.2291168

Filename

6727484