Title :
Aging data analysis methods based on short-term aging test
Author :
Lu, Guoguang ; Huang, Yun ; En, Yunfei
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
Abstract :
Lifetime is a key parameter for electronic products using, and how to obtain the lifetime by using a short-term aging data has become a challenging issue. In this paper, a new aging data analysis method will be introduced, and three groups of aging data for high power laser diodes will be as a case to expound this method. The aging test time will be greatly decreased by using this method.
Keywords :
ageing; life testing; semiconductor lasers; aging data analysis methods; aging test time; electronic products; high power laser diodes; short-term aging test; Aging; Analytical models; Data models; Degradation; Equations; Mathematical model; Reliability; acceleration factor; aging test; laser diode; lifetime; thermal activation energy;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2012 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-0786-4
DOI :
10.1109/ICQR2MSE.2012.6246372
