DocumentCode :
2701340
Title :
The USA emission and immunity EMC specifications
Author :
Heirman, Donald N.
Author_Institution :
Lucent Technol. Inc., Holmdel, NJ, USA
fYear :
1996
fDate :
19-23 Aug 1996
Firstpage :
12
Lastpage :
17
Abstract :
The need for designing electromagnetic compatibility (EMC) into commercial products has intensified, especially since international EMC regulations have proliferated in the past two years. Manufacturers must build a single product that meets all the relevant EMC requirements no matter where in the world the product is marketed. This means that a single set of harmonized standards is highly desirable. Commercial-application EMC standards in the USA have kept pace with this growing trend. This paper make comparisons, where they exist, between USA and IEC standards to show the growing trend towards harmonization. This paper also presents activity in the United States in developing commercial EMC standards, especially in the area of methods of measurement. The Federal Communications Commission (FCC) in fact has adopted the ANSI C63.4 method of measurement for emissions while allowing the use of either the FCC Part 15 or the IEC/CISPR Publication 22 limits. Some of the major activities on immunity methods of measurement are reviewed. Finally, an update is included of relevant FCC actions as they relate to standardization
Keywords :
ANSI standards; electromagnetic compatibility; electromagnetic interference; measurement standards; standardisation; FCC Part 15; Federal Communications Commission; IEC standards; IEC/CISPR Publication 22 limits; USA standards; commercial EMC standards; commercial products; electromagnetic compatibility; emission EMC specifications; harmonized standards; immunity EMC specifications; immunity measurement methods; international EMC regulations; standardization; ANSI standards; Electromagnetic Compatibility - c63; Electromagnetic compatibility; FCC; IEC standards; Immune system; Measurement standards; Military standards; Standards development; Standards organizations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
Type :
conf
DOI :
10.1109/ISEMC.1996.561192
Filename :
561192
Link To Document :
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