• DocumentCode
    2701855
  • Title

    Voltage transient detection and induction for debug and test

  • Author

    Petersen, Rex ; Pant, Pankaj ; Lopez, Pablo ; Barton, Aaron ; Ignowski, Jim ; Josephson, Doug

  • Author_Institution
    Intel Corp., Hudson, MA, USA
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.
  • Keywords
    circuit testing; transient analysis; circuit activity; debug and test; induction; voltage transient detection; Attenuation; Diffraction; Geology; Microwave propagation; Nonuniform electric fields; Polarization; Propagation losses; Receiving antennas; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355542
  • Filename
    5355542
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2701855