DocumentCode :
2701870
Title :
Near-field imaging and simultaneous charge detection with a semiconductor probe tip
Author :
Hipp, Markus ; Mertz, Jerome ; Marti, O. ; Mlynek, Jaroslav
Author_Institution :
Universitat Konstanz
fYear :
1994
fDate :
29 Aug-2 Sep 1994
Firstpage :
110
Lastpage :
111
Keywords :
Dielectrics; Electromagnetic analysis; Electromagnetic propagation; Frequency; Lattices; Optical propagation; Optimized production technology; Photonic band gap; Photonic crystals; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN :
0-7803-1791-2
Type :
conf
DOI :
10.1109/EQEC.1994.698219
Filename :
698219
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2701870
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