• DocumentCode
    2701882
  • Title

    Development of adhesion promoters to enhance polymer/substrate interface toughness

  • Author

    Im, J. ; Stokich, T., Jr. ; Hetzner, J. ; Buske, G. ; Curphy, J. ; Shaffer, E.O., II ; Meyers, G.

  • Author_Institution
    Dow Chem. Co., Midland, MI, USA
  • fYear
    1999
  • fDate
    14-17 Mar 1999
  • Firstpage
    53
  • Lastpage
    56
  • Abstract
    The adhesion performance of photo-BCB coatings were investigated using a new adhesion promoter, AP-3000, based on vinyltriacetoxysilane (VTAS) chemistry. A modified edge lift-off test (m-ELT) was employed to evaluate adhesion performance of photo-BCB on various surfaces: Si, SiN, Cu, and Al. Use of AP-3000 resulted in a large improvement of adhesion energies for these interfaces. Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) of these interfaces showed cohesive interfacial failure into the photo-BCB phase. The interfacial fracture energies approached the fracture toughness of photo-BCB, ca. 45 J/m2
  • Keywords
    X-ray photoelectron spectra; adhesion; atomic force microscopy; dielectric thin films; failure analysis; fracture toughness; interface structure; optical polymers; packaging; polymer films; AFM; AP-3000 adhesion promoter; Al; Al surface; Cu; Cu surface; Si; Si surface; SiN; SiN surface; VTAS chemistry; X-ray photoelectron spectroscopy; XPS; adhesion energy; adhesion performance; adhesion promoters; atomic force microscopy; cohesive interfacial failure; fracture toughness; interfacial fracture energy; modified edge lift-off test; photo-BCB; photo-BCB coatings; photo-BCB phase; polymer/substrate interface toughness; vinyltriacetoxysilane chemistry; Adhesives; Atomic force microscopy; Chemistry; Coatings; Photoelectron microscopy; Polymers; Silicon compounds; Spectroscopy; Surface cracks; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-56-4
  • Type

    conf

  • DOI
    10.1109/ISAPM.1999.757286
  • Filename
    757286