• DocumentCode
    2701912
  • Title

    Hierarchical yield estimation of large analog integrated circuits

  • Author

    Kurker, Christopher M. ; Paulos, John J. ; Gyurcsik, Ronald S. ; Lu, Jye-Chyi

  • fYear
    1992
  • fDate
    3-6 May 1992
  • Abstract
    A hierarchical methodology for parametric yield estimation is presented. The methodology employs a combination of behavioral and regression modeling. Three related techniques for hierarchical yield estimation are demonstrated on a large BiCMOS circuit combining discrete-time and continuous-time operation.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-0246-X
  • Type

    conf

  • DOI
    10.1109/CICC.1992.589964
  • Filename
    5727277
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2701912