Title :
Electrical observation of one dimensional sub-band structure of carbon nanotube in schottky barrier transistor
Author :
Kamimura, T. ; Maeda, M. ; Nagamune, Y. ; Nakanishi, T. ; Matsumoto, K.
Keywords :
Capacitance measurement; Carbon nanotubes; Chemical vapor deposition; Electric variables measurement; Gold; Quantum capacitance; Schottky barriers; Silicon; Temperature; Voltage;
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN :
0-7803-9040-7
DOI :
10.1109/DRC.2005.1553163