Title :
Cache-resident self-testing for I/O circuitry
Author :
Gurumurthy, Sankar ; Bertanzetti, Darren ; Jakobsen, Peter ; Rearick, Jeff
Author_Institution :
Adv. Micro Devices, Inc., Austin, TX, USA
Abstract :
A technique is described for testing the I/O interfaces of a microprocessor through the use of cache-resident self-test. Experimental results show that this test application method executes much faster than traditional scan-based testing for both characterization and production versions of the tests. The addition of on-chip post-processing of test results further enhances the speedup. The method is compatible with low-cost testers.
Keywords :
integrated circuit testing; microprocessor chips; I/O circuitry; cache-resident self-testing; low-cost testers; microprocessor; on-chip post-processing; Attenuation; Built-in self-test; Circuits; Diffraction; Geology; Microwave propagation; Nonuniform electric fields; Polarization; Propagation losses; Receiving antennas;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355549
