• DocumentCode
    2702236
  • Title

    Electromagnetic interferences caused by the common-mode noises from stacked I/O connectors and their treatments

  • Author

    Kuo, Li-Ruei ; Chou, Hsi-Tseng ; Lee, Yung-Sen ; Chou, Hsi-Hsir

  • Author_Institution
    Commun. Res. Center, Yuan Ze Univ., Chungli, Taiwan
  • fYear
    2010
  • fDate
    Aug. 28 2010-Sept. 3 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The electromagnetic interferences (EMI) caused by noises resulted from the common mode of stacked I/O connectors are analyzed using both numerical simulations and experimental measurements. A strategy is presented to suppress the noise level and its emission as well, which is found to be very effective as shown in our examination.
  • Keywords
    electric connectors; electromagnetic interference; EMI; common-mode noises; electromagnetic interferences; stacked I/O connectors; Electromagnetic interference; Electromagnetics; Magnetic fields; Noise; Numerical simulation; Pins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Information Technology and Systems (ICWITS), 2010 IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-7091-4
  • Type

    conf

  • DOI
    10.1109/ICWITS.2010.5611967
  • Filename
    5611967
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2702236