• DocumentCode
    2702476
  • Title

    Flip chip packaging

  • Author

    Werner, R.G. ; Frear, D.R. ; DeRosa, J. ; Sorongon, E.

  • Author_Institution
    Sematech, Austin, TX, USA
  • fYear
    1999
  • fDate
    14-17 Mar 1999
  • Firstpage
    246
  • Lastpage
    251
  • Abstract
    Some of the needs for improved performance can be met with versions of the packaging solutions that have been developed over the last 5-10 years. These solutions have typically focused on peripheral packages with wire bond chip-to-package interconnects. As the number of leads increases, this type of package becomes problematical. An alternative to peripheral interconnect packaging is to access the unused area under the chip and package for interconnects in an area array. In area array packaging, the surface of the chip has an array of solder interconnects (solder bumps) that are joined to a substrate when the chip is flipped over (flip chip packaging). The interconnects are then redistributed through the BGA substrate. Even with the advantages created by area array packaging, processing, performance, reliability, and cost requirements are challenging currently available area array electronic package design. This paper addresses some of the critical challenges facing flip chip electronic packaging
  • Keywords
    ball grid arrays; flip-chip devices; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microassembling; soldering; BGA substrate; area array electronic package design; area array interconnects; area array packaging; area array packaging cost; area array packaging performance; area array packaging processing; area array packaging reliability; flip chip electronic packaging; flip chip packaging; interconnect redistribution; packaging; peripheral interconnect packaging; peripheral packages; solder bump array; solder interconnects; wire bond chip-to-package interconnects; Cost function; Electronic packaging thermal management; Electronics packaging; Flip chip; Heat sinks; Lead; Process design; Semiconductor device packaging; Silicon devices; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-56-4
  • Type

    conf

  • DOI
    10.1109/ISAPM.1999.757321
  • Filename
    757321