Title :
Studies of N-type indium tin sulfide (InxSnyS) thin films using electrochemical deposition technique
Author :
Sahdan, M.Z. ; Vequizo, J.J.M. ; Abdel Haleem, A.M. ; Rusop, M. ; Ichimura, M.
Author_Institution :
Fac. of Electr. & Electron. Eng., Univ. Tun Hussein Onn Malaysia, Batu Pahat, Malaysia
Abstract :
Tin sulfide (SnS) films usually possess p-type electrical conductivity. Indium tin sulfide (InxSnyS) thin films were deposited on indium-tin-oxide coated glass by electrochemical deposition from an aqueous solution containing Na2S2O3, SnSO4, and In2(SO4)3. Different concentration of In2(SO4)3 was added to observe the effects on the structural and electrical properties. All thin films were deposited for the duration of 12 minutes. The thickness of the thin film was measured to be around 0.5 μm. The as-deposited thin films were characterized by scanning electron microscope, X-ray diffraction, Auger electron microscopy (AES) and photo-electro-chemical measurement We observed that the SnS surface morphologies changed when different concentration of indium was added. In this research, a transformation of p-type to n-type conductivity was revealed with additional of In2(SO4)3 greater than 1 mM concentration.
Keywords :
Auger electron spectra; IV-VI semiconductors; X-ray diffraction; electrical conductivity transitions; electrodeposition; indium compounds; photoelectrochemistry; scanning electron microscopy; semiconductor growth; semiconductor thin films; surface morphology; tin compounds; Auger electron microscopy; InxSnyS; X-ray diffraction; aqueous solution; electrical properties; electrochemical deposition; n-type thin films; p-type electrical conductivity; photoelectrochemical measurement; scanning electron microscopy; structural properties; surface morphology; time 12 min; Chemical elements; Films; Surface treatment; Tin; Turning; Auger electron microscopy; Electrochemical deposition; Indium Sulfide; Photoelectrochemical; Tin Sulfide;
Conference_Titel :
Photonics (ICP), 2011 IEEE 2nd International Conference on
Conference_Location :
Kata Kinabalu
Print_ISBN :
978-1-61284-265-3
Electronic_ISBN :
978-1-61284-263-9
DOI :
10.1109/ICP.2011.6106855
