• DocumentCode
    2702678
  • Title

    Analysis and design of Coplanar Waveguide-to-Rectangular Waveguide transition with FDTD method

  • Author

    Deng, Jianqin ; Jiang, Wanshun ; Ning, Yuemin

  • Author_Institution
    41st Inst., Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., China Electron. Technol. Group Corp., Qingdao, China
  • fYear
    2009
  • fDate
    27-29 Oct. 2009
  • Firstpage
    596
  • Lastpage
    599
  • Abstract
    A broadband coplanar waveguide-to-rectangular waveguide transition is proposed in this paper. The transition consists of a very thin metal ridge, with the shape like a square of cosine curve, located longitudinally on the bottom broadwall of a rectangular waveguide. The ridge guides the power to a slot of triangle cut in the center of the top broadwall of the rectangular waveguide. This structure can result in a smooth field transition between 70 GHz and 120 GHz. The simulation result is achieved by FDTD method, and the result shows that the insertion loss is very low in the transition. This transition is very useful in various applications, such as mixer, multiplier and so on. Furthermore, some conclusions illustrated in this paper can be used to design the transition in many different frequency ranges.
  • Keywords
    coplanar waveguides; finite difference time-domain analysis; mixers (circuits); multiplying circuits; rectangular waveguides; FDTD method; broadband coplanar waveguide; cosine curve square; frequency 70 GHz to 120 GHz; mixer; multiplier; rectangular waveguide transition; smooth field transition; thin metal ridge; Circuits; Coplanar waveguides; Electromagnetic waveguides; Finite difference methods; MIMICs; Millimeter wave technology; Planar waveguides; Probes; Rectangular waveguides; Waveguide transitions; FDTD; Transition of CPW to Rectangular Waveguide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4076-4
  • Type

    conf

  • DOI
    10.1109/MAPE.2009.5355580
  • Filename
    5355580