DocumentCode
2702689
Title
Keynote address
Author
Domic, Antun
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
12
Lastpage
12
Abstract
The author describes how design, manufacturing, and test can join forces, and collaborate to battle the nanometer challenges in the semiconductor industry.
Keywords
design for manufacture; design for testability; integrated circuit manufacture; integrated circuit testing; nanoelectronics; design-aware test; lithography; manufacturing-aware test; microbridges; semiconductor industry; test patterns;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Type
conf
DOI
10.1109/TEST.2009.5355581
Filename
5355581
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