• DocumentCode
    2702892
  • Title

    Innovative adaptations of commercial flash memories for military systems

  • Author

    Verma, Vandana ; Swaneck, Andrew

  • Author_Institution
    Intel Corp., USA
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 May 1996
  • Firstpage
    800
  • Abstract
    The advantages of using a commercial-grade component in military systems are cost and availability. This perception, coupled with the idea that commercial components adequately meet the quality and reliability requirements of the military systems marketplace, tempts the military system designer to utilize commercial components. The disadvantages of this practice far outweigh the advantages. This paper discusses these disadvantages by comparing the device performance of commercial grade components and of those adapted for the military systems marketplace. A comparison of cost, availability, and quality is discussed in great detail. Using flash memory as a vehicle, data will be presented, which compares commercial flash memories and adapted flash memories. Adapted flash memories are commercial flash memory components specially configured and screened for military operating environments. This supports the commercial-of-the-shelf (COTS) trends in the military marketplace. Data will be presented showing specific examples of the improvements and the device performance gained when using adapted flash memories. Characteristics of these devices include device optimization at temperature extremes, and implementations of innovative test techniques
  • Keywords
    cellular arrays; circuit optimisation; economics; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; integrated memory circuits; military equipment; adapted memories; availability; commercial-of-the-shelf trends; cost; device optimization; device performance; flash memories; military operating environments; military systems; reliability requirements; test techniques; Availability; Costs; Flash memory; Logic devices; Logic testing; Manufacturing processes; Reliability engineering; Semiconductor device manufacture; Semiconductor device testing; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National
  • Conference_Location
    Dayton, OH
  • ISSN
    0547-3578
  • Print_ISBN
    0-7803-3306-3
  • Type

    conf

  • DOI
    10.1109/NAECON.1996.517743
  • Filename
    517743