Title :
Dynamic mechanical analysis of silver/glass die attach material
Author :
Hongsmatip, Trirat ; Twombly, Benjamin
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Abstract :
Dynamic mechanical analysis (DMA) was employed to characterize the modulus behavior of a silver filled glass material. The method employed a simulated die attach process to understand the behavior of the storage modulus and the complex viscosity. Of specific interest are the various physical states of the silver glass material during the temperature excursions. Thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) were also employed to describe the transition stages of the material. A marked decrease in probe position during heating, which indicated the decrease in thickness of the silver glass paste, described the initiation of glass wetting the Ag flake and coalescing to form a glass-Ag composite. The analysis showed that the material remained in a low viscosity throughout this process. Solidification of the composite material occurred during the cooling cycle as the temperature went through the glass transition temperature, unlike thermoset polymers, in which gelation and curing occur during the heating process. The storage modulus of the solidified material was also verified by the three-point bending technique
Keywords :
calorimetry; composite materials; elastic moduli; glass; glass transition; integrated circuit packaging; microassembling; silver; solidification; thermal analysis; viscosity; wetting; Ag; Ag filled glass material; Ag flake; Ag/glass die attach material; complex viscosity; differential scanning calorimetry; dynamic mechanical analysis; glass transition temperature; modulus behavior; solidification; storage modulus; temperature excursions; thermogravimetric analysis; three-point bending technique; wetting; Calorimetry; Composite materials; Glass; Heating; Material storage; Microassembly; Probes; Silver; Temperature; Viscosity;
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
DOI :
10.1109/ECTC.1995.517764