• DocumentCode
    2703368
  • Title

    Polyimide stress cushion for multichip glass-ceramic module packaging

  • Author

    Shih, D.-Y. ; Palmateer, P. ; Fu, Y. ; Kapur, S. ; Ghosal, B. ; Brofman, P. ; Lauro, P. ; Norcott, M.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    728
  • Lastpage
    738
  • Abstract
    The performance of the IBM glass ceramic-copper multilayer ceramic module (MLC) is significantly enhanced by a revolutionary set of packaging materials. Low dielectric constant cordierite glass ceramic (ε-5.0), co-sintered with high conductivity copper (ρ-3.5 μΩ-cm), was developed and integrated into the high performance glass ceramic thermal conduction modules (TCM) used in the IBM System/390-Enterprise system/9000 series of mainframe computers. Low stress pin attach structures have been developed for the glass ceramic module. They include the multilayer thin film I/O pad, taper headed pin and polyimide-cushioned pin structure. All of the approaches were shown to reduce the pin joint stress significantly and, as a consequence, led to the construction of a robust pin joint that is fully compatible with the glass ceramic substrate
  • Keywords
    ceramics; integrated circuit packaging; multichip modules; permittivity; polymer films; sintering; IBM System/390-Enterprise system/9000; IC packaging; cordierite glass ceramic; cosintering; dielectric constant; multichip glass-ceramic module; multilayer thin film I/O pad; packaging materials; pin attach structures; pin joint stress; polyimide stress cushion; polyimide-cushioned pin structure; taper headed pin; thermal conduction modules; Ceramics; Conducting materials; Dielectric constant; Dielectric materials; Glass; Nonhomogeneous media; Packaging; Polyimides; Stress; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517768
  • Filename
    517768