• DocumentCode
    2703633
  • Title

    Test Mode Entry and Exit Methods for IEEE P1581 compliant devices

  • Author

    Ehrenberg, Heiko

  • Author_Institution
    IEEE P1581 Working Group, GOEPEL Electron. - Austin, Austin, TX, USA
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    IEEE P1581 is aimed at ICs that are otherwise not provisioned with design for test (DFT) for any reason, targeting primarily memory devices, but also allowing for implementation in other devices. This poster provides an overview of test mode entry and exit methods proposed in IEEE P1581.
  • Keywords
    integrated circuit testing; integrated memory circuits; IC; IEEE P1581 compliant devices; memory devices; test mode entry method; test mode exit method; Automatic testing; Circuit testing; Electronic equipment testing; Integrated circuit testing; Logic testing; Pins; Protocols; Read-write memory; System testing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355636
  • Filename
    5355636
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2703633